| Full record |
| Title: | Hard-to-Detect Faults by Dynamic Current Sensor in Analogue Circuits |
| Type: | International Conference |
| Where: | 3rd IEEE Latin-American Test Workshop, LATW2002. Montevideo (Uruguay) |
| Date: | 2002-02 |
| Authors: |
Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
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| R&D Lines: |
Test methods of digital and mixed integrated circuits
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| Projects: |
Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
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| ISBN: | |
| PDF File: |
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| Abstract: | In switched analogue and continuous time circuits there are faults difficult to detect using test methods based on voltage or power supply current monitoring. However, it is possible to detect these faults if we include to the conventional dynamic power supply current test methods IDDT the analysis of the changes in the slope of this dynamic power supply current of the circuit under test.
In this work, a test method is presented based on the measurement of the transients appearing in the supply currents flowing in switched-current analogue circuits (SI). An extension of this technique to continuous-time analogue circuits is explored.
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