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Title:	Test generation in algorithmic switched current ADCs
Type:	International Conference
Where:	9th International Mixed-Signal Testing Workshop (IMSTW2003). Sevilla
Date:	2003-06
Authors:	Yolanda Lechuga Román Mozuelos Mar Martínez Salvador Bracho
R&D Lines:	Test methods of digital and mixed integrated circuits
Projects:	Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
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