| Full record |
| Title: | Test of a Switched Capacitor ADC by a Built-In Charge Sensor |
| Type: | International Paper |
| Where: | Microelectronics Journal 36 (12): 1064-1072 |
| Date: | 2005-11 |
| Authors: |
Román Mozuelos
Yolanda Lechuga
Mar Martínez
Salvador Bracho
|
| R&D Lines: |
Test methods of digital and mixed integrated circuits
|
| Projects: |
Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
|
| ISBN: | 0026-2692 |
| PDF File: |
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| Abstract: | A test methodology for switched capacitor circuits is described. The test approach uses a built-in sensor to analyze the charge transfer inside the circuit under test (CUT). The test methodology is applied to a 10-bit algorithmic analog to digital converter to characterize the static linearity and to obtain the simulated fault coverage figures taking into account a catastrophic fault model. The goodness of the charge sensor has been experimentally evaluated with an SC integrator for fault detection and built-in sensor influence on the CUT performances. |
