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Title:	DfT Behavioural Description for Folded ADCs
Type:	International Conference
Where:	12th IEEE International Mixed-Signals Testing Workshop (IMSTW´06) Edinburgh(UK)
Date:	2006-06
Authors:	Román Mozuelos Yolanda Lechuga Mar Martínez Salvador Bracho
R&D Lines:	Test methods of digital and mixed integrated circuits
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