Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
Home    Staff    Research    Teaching    Doctorate    Publications    Tools    versión en español Sun 22-Dec-24 . 03:24



Web Map


Location

News

Santander Info

GIM>Research>Publication
   PUBLICATION
 
   Full record
Title:Optimization of a Structural DfT Targeting Fault Detection on High‐Speed ADCs
Type:International Conference
Where:European Test Symposium (ETS'09). Sevilla(E)
Date:2009-05
Authors: Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Métodos de Test Funcionales y Estructurales: Aplicacion al Autotest de Ci...
ISBN:
PDF File:
Abstract:
© Copyright GIM (TEISA-UC)    ¤    All rights reserved.    ¤    Legal TermsE-Mail Webmaster