Microelectronics Engineering Group

Microelectronics Engineering Group

 Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Current fault modeling in VITAL
Type:International Conference
Where:XI Conference Design of Integrated Circuits and Systems (DCIS´96). Sitges (Barcelona).
Date:1996-11
Authors: J. L. Barreda
Pablo Pedro Sánchez
R&D Lines: Design and verification of electronic systems for communications
Projects:
ISBN:84-89349-83-5
PDF File:
Abstract:
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