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Title:	Design for Test (DfT) study on a current mode DAC
Type:	International Paper
Where:	IEE Circuits, Devices and Systems. Volume 143, Number 6, pp 374-379
Date:	1996-12
Authors:	T. Olbrich Román Mozuelos A. Richardson Salvador Bracho
R&D Lines:	Test methods of digital and mixed integrated circuits
Projects:
ISBN:	1350-2409
PDF File:
Abstract:


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