Microelectronics Engineering Group

Microelectronics Engineering Group

Electronics Technology, Systems and Automation Engineering Department University of Cantabria
Home    Staff    Research    Teaching    Doctorate    Publications    Tools    versión en español Fri 29-Mar-24 . 03:18



Web Map


Location

News

Santander Info

GIM>Research>Publication
   PUBLICATION
 
   Full record
Title:Design for Test (DfT) study on a current mode DAC
Type:International Paper
Where:IEE Circuits, Devices and Systems. Volume 143, Number 6, pp 374-379
Date:1996-12
Authors: T. Olbrich
Román Mozuelos
A. Richardson
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects:
ISBN:1350-2409
PDF File:
Abstract:
© Copyright GIM (TEISA-UC)    ¤    All rights reserved.    ¤    Legal TermsE-Mail Webmaster