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| GIM>Research>Publication |
| PUBLICATION |
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| Full record |
| Title: | Model-Driven Analysis of Security, Reliability, Test, Privacy, Safety and Trust of IoE Services
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| Type: | International Conference |
| Where: | Surrealist Workshop of the IEEE European Test Symposium, Bremen, Germany |
| Date: | 2018-05 |
| Authors: |
Eugenio Villar
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| R&D Lines: |
Design and verification of HW/SW embedded systems
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| Projects: |
ECSEL 737494-2 MegaMart2
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| ISBN: | |
| PDF File: | see file
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| Abstract: | In this presentation, Model-Driven, electronic system design for the IoE is discussed. Modeling of extra-functional poperties such as Security, Reliability, Test, Privacy, Safety and Trust of IoE Services is described. A single-source approach supported by powerful design tools is proposed. Background results from previous projects are described and its further exploitation through the ECSEL MegaMart project, presented. |
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