| Ficha completa |
| Título: | Hard-to-Detect Faults by Dynamic Current Sensor in Analogue Circuits |
| Tipo: | Publicacion en Proceedings o Actas internacionales |
| Lugar: | 3rd IEEE Latin-American Test Workshop, LATW2002. Montevideo (Uruguay) |
| Fecha: | 2002-02 |
| Autores: |
Yolanda Lechuga
Román Mozuelos
Mar Martínez
Salvador Bracho
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| Líneas: |
Métodos de test de circuitos integrados digitales y mixtos
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| Proyectos: |
Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
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| ISBN: | |
| Fichero: |
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| Resumen: | In switched analogue and continuous time circuits there are faults difficult to detect using test methods based on voltage or power supply current monitoring. However, it is possible to detect these faults if we include to the conventional dynamic power supply current test methods IDDT the analysis of the changes in the slope of this dynamic power supply current of the circuit under test.
In this work, a test method is presented based on the measurement of the transients appearing in the supply currents flowing in switched-current analogue circuits (SI). An extension of this technique to continuous-time analogue circuits is explored.
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