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| GIM>Investigación>Publicación |
| PUBLICACION |
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| Ficha completa |
| Título: | Model-Driven Analysis of Security, Reliability, Test, Privacy, Safety and Trust of IoE Services
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| Tipo: | Comunicaciones a congresos internacionales |
| Lugar: | Surrealist Workshop of the IEEE European Test Symposium, Bremen, Germany |
| Fecha: | 2018-05 |
| Autores: |
Eugenio Villar
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| Líneas: |
Diseño y verificación de sistemas embebidos HW/SW
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| Proyectos: |
ECSEL 737494-2 MegaMart2
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| ISBN: | |
| Fichero: | ver fichero
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| Resumen: | In this presentation, Model-Driven, electronic system design for the IoE is discussed. Modeling of extra-functional poperties such as Security, Reliability, Test, Privacy, Safety and Trust of IoE Services is described. A single-source approach supported by powerful design tools is proposed. Background results from previous projects are described and its further exploitation through the ECSEL MegaMart project, presented. |
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