| Ficha completa |
| Título: | Experimental Evaluation of a Built-in Current Sensor for Analog Circuits |
| Tipo: | Publicacion en Proceedings o Actas internacionales |
| Lugar: | XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France) |
| Fecha: | 2004-11 |
| Autores: |
Román Mozuelos
Yolanda Lechuga
Miguel Angel Allende
Mar Martínez
Salvador Bracho
|
| Líneas: |
Métodos de test de circuitos integrados digitales y mixtos
|
| Proyectos: |
Técnicas de Test para Circuitos Mixtos, Analógicos-Digitales. Aplicación ...
|
| ISBN: | 2-9522971-0-X |
| Fichero: |
|
| Resumen: | This paper shows the experimental characterization of a built-in current sensor for analog circuits. This BICS emphasizes the highest harmonics of the CUT current when the current to voltage conversion is done.
The proposed test methodology is also validated using a benchmark circuit, which has been fabricated with the AMS 0.6 micron technology. The discrimination between the fault-free circuit and the faulty ones can be easily done by means of the measured value of the pulse width at the output of the BICS. |
