Microelectronics Engineering Group

Microelectronics Engineering Group

 Electronics Technology, Systems and Automation Engineering Department University of Cantabria
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Title:Dynamic Current Test of Switched-current Building-blocks
Type:International Conference
Where:15th Design of Circuits and Integrated Systems Conference (DCIS 2000). Montpellier (Francia)
Date:2000-11
Authors: Yolanda Lechuga
Mar Martínez
Salvador Bracho
R&D Lines: Test methods of digital and mixed integrated circuits
Projects: Métodos de diseño para test y test de tensión e intensidad en circuitos d...
ISBN:
PDF File:
Abstract:
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