Mapa Web
Localización
Noticias
Info Santander
Gestión BD
|
| GIM>Investigación>Publicaciones |
| PUBLICACIONES originadas dentro del proyecto: "Técnicas de Test para Circuitos Mi..." ordenadas por fecha |
| |
| 2005 |
 |
Y. Lechuga, R. Mozuelos, M. Allende, M. Martínez, S. Bracho
"Fault detection in switched current circuits using built-in transient current sensors"
Journal of Electronic Testing-Theory and Applications 21 (6): 583-598. 2005-12 |
 |
|
|
|
R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Test of a Switched Capacitor ADC by a Built-In Charge Sensor"
Microelectronics Journal 36 (12): 1064-1072. 2005-11 |
|
|
|
 |
Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Design for Test of High-Speed Folded ADCs"
XX Conference on
Design of Circuits and Integrated Systems(DCIS 2005) Lisboa(P). 2005-11 |
|
|
|
 |
Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Test de Preamplificadores en Convertidores A/D Doblados"
Proc. of the XII Annual Seminar on Automatic Control, Industrial Electronics and Instrumentation (SAAEI 2005), Santander. 2005-09 |
|
|
|
|
R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Test of Averaged Preamplifiers in Folded ADCs "
11th IEEE International Mixed-Signals Testing Workshop (IMSTW 2005) Cannes(F). 2005-06 |
|
|
|
| 2004 |
|
R. Mozuelos, Y. Lechuga, M. Allende, M. Martínez, S. Bracho
"Experimental Evaluation of a Built-in Current Sensor for Analog Circuits"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11 |
|
|
|
|
Y. Lechuga, R. Mozuelos, M. Allende, M. Martínez, S. Bracho
"Experimental Analysis of Transient Current Test Based on dIDD Variations in S2I Memory Cells"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11 |
|
|
|
|
R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"Characterization of an SC ADC by a Built-In Charge Sensor"
10th International Mixed-Signal Testing Workshop (IMSTW2004). Portland (USA). 2004-06 |
|
|
|
| 2003 |
|
Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Dynamic Current Testing Strategies for S2I Algorithmic A/D Converters"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11 |
|
|
|
|
R. Mozuelos, Y. Lechuga, M. Martínez, S. Bracho
"SC Algorithmic ADC Test with a Built-In Charge Sensor"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11 |
|
|
|
|
Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Test generation in algorithmic switched current ADCs"
9th International Mixed-Signal Testing Workshop (IMSTW2003). Sevilla. 2003-06 |
|
|
|
|
Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Built-In Sensor Based on Current Supply High-Frequency Behaviour"
Electronic Letters, Vol 39, No. 9. 2003-05 |
|
|
|
|
Y. Lechuga, M. Martínez, S. Bracho
"Fault Detection in Algorithmic ADC Monitoring Charge in SC Converters and Dynamic Current in SI Converters"
IX Workshop IBERCHIP (IWS´2003). La Habana (Cuba). 2003-03 |
|
|
|
| 2002 |
|
Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Fault detection in algorithmic switched-current ADC using built-in sensors"
XVII Conference on Design of Circuits and Integrated Systems (DCIS 2002). Santander. 2002-11 |
|
|
|
|
Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Built-in Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal ICs"
Design, Automation and Test in Europe, DATE 2002. Paris (France). 2002-03 |
|
|
|
|
Y. Lechuga, R. Mozuelos, M. Martínez, S. Bracho
"Hard-to-Detect Faults by Dynamic Current Sensor in Analogue Circuits"
3rd IEEE Latin-American Test Workshop, LATW2002. Montevideo (Uruguay). 2002-02 |
|
|
|
|
|
