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GIM>Investigación>Publicaciones |
PUBLICACIONES originadas dentro del proyecto: "Métodos de Test Funcionales y Estr..." ordenadas por fecha |
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2013 |
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Behavioral model of folded and interpolated ADCs for test evaluation—Case study: Structural DfT method"
Microelectronics Journal, Volume 44, Issue 5, May 2013, Pages 382–392. 2013-05 |
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2011 |
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Structural Test Approach for Embedded Analog Circuits based on a Built-In Current Sensor"
Journal of Electronic Testing (Springer). 2011-04 |
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2010 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Fault Evaluation of a Distributed Preamplifying Stage of a High-Speed Folded ADC"
XXV Conference on Design of Circuits and Integrated Systems, DCIS'10. 2010-11 |
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Test of Embedded Analog Circuits based on a Built-In Current Sensor"
European Test Symposium 2010, ETS10. 2010-05 |
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Test based on Built-In Current Sensors for Mixed-Signal Circuits"
Emerging Trends in Technological Innovation, IFIP AICT 314, Springer. 2010-02 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Structural DfT Strategy for High-speed ADCs"
Emerging Trends in Technological Innovation, IFIP AICT 314, Springer*. 2010-02 |
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2009 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Optimization of a Structural DfT Targeting Fault Detection on High‐Speed ADCs"
European Test Symposium (ETS'09). Sevilla(E). 2009-05 |
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M.Martínez, S.Bracho, R.Mozuelos, M.A.Allende
"Tecnologías Colaborativas en un Curso de Circuitos Microelectrónicos"
Informática 2009, Segundo Simposio Internacional de Computación y Electrónica, La Habana (Cuba). 2009-02 |
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2008 |
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Yolanda Lechuga, Ahcène Bounceur, Román Mozuelos, Mar Martínez, Salvador Bracho, Salvador Mir
"Test Limit Evaluation for an ADC Structural Design-for-Test Approach by using a CAT Platform"
Proceedings of the Conference on Design of Circuits and Integrated Systems DCIS 2008, Grenoble (Francia). 2008-11 |
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