Grupo de Ingeniería Microelectrónica

Grupo de Ingeniería Microelectrónica

Departamento de Tecnología Electrónica, Ingeniería de Sistemas y Automática Universidad de Cantabria
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   PUBLICACIONES en las que participa: "Román Mozuelos" ordenadas por línea de investigación
 
   Métodos de test de circuitos integrados digitales y mixtos
conferencia Jose Angel Miguel, Yolanda Lechuga, Román Mozuelos, Mar Martínez
"Fault injection in an implantable MEMS-based pressure sensing device"
Proceedings of the 28th Design of Circuits and Integrated Systems Conference (DCIS 2013). 2013-11
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revista Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Behavioral model of folded and interpolated ADCs for test evaluation—Case study: Structural DfT method"
Microelectronics Journal, Volume 44, Issue 5, May 2013, Pages 382–392. 2013-05
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conferencia Jose Angel Miguel, Yolanda Lechuga, Román Mozuelos, Mar Martínez
"Implantable Sensor System for Remote Detection of a Restenosis Condition"
4th Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS 2013). 2013-04
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conferencia Jose Angel Miguel, Yolanda Lechuga, Román Mozuelos, Mar Martínez
"Modeling of an implantable device for remote arterial pressure measurement"
SPIE Microtechnologies 2013. 2013-04
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conferencia Jose Angel Miguel, Román Mozuelos, Mar Martínez
"Modelling an implantable sensor system for restenosis monitorization in the pulmonary artery"
XXVII Conference on Design of Circuits and Integrated Systems (DCIS12) . 2012-11
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conferencia Jose Angel Miguel, Román Mozuelos, Mar Martínez
"Behavioural Analysis of an Implantable Flow and Pressure Sensing Device"
International Conference on Biomedical Electronics and Devices (Biodevices 2012). 2012-02
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revista Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Structural Test Approach for Embedded Analog Circuits based on a Built-In Current Sensor"
Journal of Electronic Testing (Springer). 2011-04
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conferencia Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Fault Evaluation of a Distributed Preamplifying Stage of a High-Speed Folded ADC"
XXV Conference on Design of Circuits and Integrated Systems, DCIS'10. 2010-11
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conferencia Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Test of Embedded Analog Circuits based on a Built-In Current Sensor"
European Test Symposium 2010, ETS10. 2010-05
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libro_c Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Test based on Built-In Current Sensors for Mixed-Signal Circuits"
Emerging Trends in Technological Innovation, IFIP AICT 314, Springer. 2010-02
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libro_c Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Structural DfT Strategy for High-speed ADCs"
Emerging Trends in Technological Innovation, IFIP AICT 314, Springer*. 2010-02
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tesis Román Mozuelos
"Test Basado en Sensores de Corriente Internos para Circuitos Integrados Mixtos (Analógicos-Digitales)"
Universidad de Cantabria. 2009-09
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conferencia Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Optimization of a Structural DfT Targeting Fault Detection on High‐Speed ADCs"
European Test Symposium (ETS'09). Sevilla(E). 2009-05
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conferencia Yolanda Lechuga, Ahcène Bounceur, Román Mozuelos, Mar Martínez, Salvador Bracho, Salvador Mir
"Test Limit Evaluation for an ADC Structural Design-for-Test Approach by using a CAT Platform"
Proceedings of the Conference on Design of Circuits and Integrated Systems DCIS 2008, Grenoble (Francia). 2008-11
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conferencia Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Structural DfT Approach on Folded ADCs"
14th IEEE International Conference on Electronics, Circuits and Systems(ICECS'2007). Marrakech(Marruecos). 2007-12
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conferencia Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"DfT Behavioural Description for Folded ADCs"
12th IEEE International Mixed-Signals Testing Workshop (IMSTW´06) Edinburgh(UK). 2006-06
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revista Yolanda Lechuga, Román Mozuelos, Miguel Angel Allende, Mar Martínez, Salvador Bracho
"Fault detection in switched current circuits using built-in transient current sensors"
Journal of Electronic Testing-Theory and Applications 21 (6): 583-598. 2005-12
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revista Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Test of a Switched Capacitor ADC by a Built-In Charge Sensor"
Microelectronics Journal 36 (12): 1064-1072. 2005-11
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conferencia Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Design for Test of High-Speed Folded ADCs"
XX Conference on Design of Circuits and Integrated Systems(DCIS 2005) Lisboa(P). 2005-11
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conferencia_n Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Test de Preamplificadores en Convertidores A/D Doblados"
Proc. of the XII Annual Seminar on Automatic Control, Industrial Electronics and Instrumentation (SAAEI 2005), Santander. 2005-09
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conferencia Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Test of Averaged Preamplifiers in Folded ADCs "
11th IEEE International Mixed-Signals Testing Workshop (IMSTW 2005) Cannes(F). 2005-06
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conferencia Román Mozuelos, Yolanda Lechuga, Miguel Angel Allende, Mar Martínez, Salvador Bracho
"Experimental Evaluation of a Built-in Current Sensor for Analog Circuits"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11
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conferencia Yolanda Lechuga, Román Mozuelos, Miguel Angel Allende, Mar Martínez, Salvador Bracho
"Experimental Analysis of Transient Current Test Based on dIDD Variations in S2I Memory Cells"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11
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conferencia Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Characterization of an SC ADC by a Built-In Charge Sensor"
10th International Mixed-Signal Testing Workshop (IMSTW2004). Portland (USA). 2004-06
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conferencia Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Dynamic Current Testing Strategies for S2I Algorithmic A/D Converters"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11
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conferencia Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"SC Algorithmic ADC Test with a Built-In Charge Sensor"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11
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conferencia Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Test generation in algorithmic switched current ADCs"
9th International Mixed-Signal Testing Workshop (IMSTW2003). Sevilla. 2003-06
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revista Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Built-In Sensor Based on Current Supply High-Frequency Behaviour"
Electronic Letters, Vol 39, No. 9. 2003-05
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conferencia Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Fault detection in algorithmic switched-current ADC using built-in sensors"
XVII Conference on Design of Circuits and Integrated Systems (DCIS 2002). Santander. 2002-11
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conferencia Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Built-in Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal ICs"
Design, Automation and Test in Europe, DATE 2002. Paris (France). 2002-03
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conferencia Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Hard-to-Detect Faults by Dynamic Current Sensor in Analogue Circuits"
3rd IEEE Latin-American Test Workshop, LATW2002. Montevideo (Uruguay). 2002-02
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conferencia Román Mozuelos, Mar Martínez, Salvador Bracho
"Built-In Sensor Based on the Time-Variation of the Transient Current Supply in Analogue Circuits"
16th Design of Circuits and Integrated Systems Conference, DCIS 2001. Oporto (Portugal). 2001-11
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conferencia Román Mozuelos, Mar Martínez, Salvador Bracho
"Catastrophic and Parametric Fault Detection By a Transient Current Test"
XIV Design of Circuits and Integrated Systems Conference.. 1999-11
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conferencia Román Mozuelos, Mar Martínez, Salvador Bracho
"Dynamic Power Supply Current Measurements for Catastrophic and Parametric Fault Detection"
4th International Mixed Signal Testing Workshop (IMSTW98). The Hague (The Netherlands). 1998-06
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conferencia Román Mozuelos, Mar Martínez, Salvador Bracho
"Sensor Performances in Dynamic Power Supply Current Test"
IEEE Hot Topic Workshop on Current Testing for Analogue and Mixed Signal Devices (CTAMS98). Paris (Francia). 1998-02
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revista T. Olbrich, Román Mozuelos, A. Richardson, Salvador Bracho
"Design for Test (DfT) study on a current mode DAC"
IEE Circuits, Devices and Systems. Volume 143, Number 6, pp 374-379. 1996-12
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conferencia_n Román Mozuelos, J. Argüelles, Mar Martínez, Salvador Bracho
"Test basado en Iddt de un convertidor digital-analógico"
Congreso de Diseño de Circuitos Integrados y Sistemas (DCIS95). Zaragoza. 1995-11
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   Formación de ingenieros en técnicas de diseño y test de circuitos VLSI
conferencia Mar Martínez, Miguel Angel Allende, Román Mozuelos, Salvador Bracho
"Microelectronics Distance Program with Extended Practical Work"
European Workshop on Microelectronics Education(EWME'2008). Budapest (Hungria). 2008-05
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conferencia Miguel Angel Allende, Román Mozuelos, Mar Martínez, Salvador Bracho
"Microelectronic Interactive Distance Course with On-line Measurement Laboratory"
3rd WSEAS International Conference on Engineering Education. Vouliaghmeni(Gr). 2006-07
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revista Miguel Angel Allende, Román Mozuelos, Mar Martínez, Salvador Bracho
"Microelectronics Interactive Distance Course with Advanced Experiments on MOS Transistors in an On-line Measurement Laboratory"
WSEAS Transaction on Advances in Engineering Education, issue 5, Vol 3, 263-268. 2006-05
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libro_c Miguel Angel Allende, Román Mozuelos, Mar Martínez, Salvador Bracho
"Distance access to test equipment in an on-line IC test course"
Microelectronics Education, EWME 2002. Universidad de Vigo (España) Marcombo Boixareu Editores. 2002-05
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conferencia_n Román Mozuelos, Miguel Angel Allende, Mar Martínez, Salvador Bracho
"Laboratorio Remoto de Test: Caracterización de un Convertidor Analógico - Digital"
V Congreso de Tecnologías Aplicadas a la Enseñanza de la Electrónica (TAEE 2002). Las Palmas de Gran Canaria. 2002-02
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conferencia Miguel Angel Allende, Román Mozuelos, Mar Martínez, Salvador Bracho
"On line IC test course with distance access to test equipment"
2nd IEEE Latin American Test Workshop. Cancún (Mexico). 2001-02
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conferencia Román Mozuelos, Mar Martínez, Salvador Bracho
"Test Laboratory"
1st Workshop of Test Network SetNet. Newcastle (UK). 2000-10
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